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Date: Mon, 25 Jun 2012 14:04:18 -0700 From: "Michael Chan" <mchan@...adcom.com> To: "Ben Hutchings" <bhutchings@...arflare.com> cc: "David Miller" <davem@...emloft.net>, netdev@...r.kernel.org, nsujir@...adcom.com, mcarlson@...adcom.com Subject: Re: [PATCH 3/3 net-next] tg3: Add sysfs file to export sensor data On Sat, 2012-06-23 at 16:02 +0100, Ben Hutchings wrote: > Temperature and voltage can be exposed through an hwmon device (which > practically means you use multiple attributes with conventional names). > Other diagnostics might possible be suitable for ethtool stats, > depending on what they are. I think we can extract some common and more useful attributes such as temperature and voltage, and use the standard hwmon attributes to expose them. > > If the driver can't easily parse the information (e.g. it varies greatly > between the different chips and firmware versions) then a binary > attribute or private ioctl might be appropriate. But generic interfaces > really should be considered first. > The rest of the bulk data requires too much parsing in the kernel and will have to be exposed as binary data. What do you mean by binary attribute? A new binary sysfs attribute under hwmon? Or outside of hwmon? And please elaborate on the private ioctl. Thanks. -- To unsubscribe from this list: send the line "unsubscribe netdev" in the body of a message to majordomo@...r.kernel.org More majordomo info at http://vger.kernel.org/majordomo-info.html
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