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Message-ID: <18ee4afb-6687-41d5-a4b3-e6a0fbd569f2@gmail.com>
Date: Mon, 8 Sep 2025 17:22:37 -0700
From: Matthew Fernandez <matthew.fernandez@...il.com>
To: fulldisclosure@...lists.org
Subject: Re: [FD]
Apple’s A17 Pro Chip: Critical Flaw Causes Dual Subsystem Failure & Forensic Log Loss
On 9/4/25 20:57, Joseph Goydish II via Fulldisclosure wrote:
> TITLE:
> APPLE'S A17 PRO SILICON FLAW: SHARED I²C4 BUS BETWEEN SECURE ENCLAVE AND DIGITIZER CAUSES CASCADING SYSTEM FAILURE
>
> …
> CONCLUSION:
> This is a HIGH-SEVERITY HARDWARE DESIGN FLAW…
Can you elaborate on why you consider this high severity? From the
description, it sounds as if this behaviour is fail-closed. That is, the
effects are limited to DoS, with security properties preserved.
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