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Message-ID: <20130320053744.GA4017@gmail.com>
Date: Wed, 20 Mar 2013 13:37:44 +0800
From: Zheng Liu <gnehzuil.liu@...il.com>
To: Eric Sandeen <sandeen@...deen.net>
Cc: xfs@....sgi.com, linux-ext4@...r.kernel.org,
Zheng Liu <wenqing.lz@...bao.com>
Subject: Re: [PATCH] xfstests 299-305: remove fio config files after finished
test
On Tue, Mar 19, 2013 at 11:19:48AM -0500, Eric Sandeen wrote:
> On 3/19/13 4:30 AM, Zheng Liu wrote:
> > From: Zheng Liu <wenqing.lz@...bao.com>
> >
> > After finished test, temporarily fio config file should be removed.
>
> Looks fine, except that in test 300 you don't do rm -f; in every
> other test -f is used. Was that intentional?
Thanks for pointing it out. It's a typo. I will submit a newer patch
to fix it.
>
> Also, while looking at this, in 305 cleanup uses "poweron_scratch_dev"
> - is that defined anywhere? I can't find it.
Yeah, I also cannot find it. I am not sure why it is called here. I
will take a look at it and make sure that we can remove it.
Regards,
- Zheng
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