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Message-ID: <aYGGHMfca4gbB2vy@infradead.org>
Date: Mon, 2 Feb 2026 21:22:36 -0800
From: Christoph Hellwig <hch@...radead.org>
To: "Darrick J. Wong" <djwong@...nel.org>
Cc: zlang@...hat.com, linux-ext4@...r.kernel.org, fstests@...r.kernel.org
Subject: Re: [PATCH 1/3] xfs/018: remove inline xattr recovery tests

On Mon, Feb 02, 2026 at 11:11:12AM -0800, Darrick J. Wong wrote:
> From: Darrick J. Wong <djwong@...nel.org>
> 
> Now that we can do xattr updates in a single transaction (as opposed to
> using the attr intent machinery) if we keep the attr structure in short
> format, remove the attr intent item log recovery tests.

I have a bit of a hard time parsing this.  Currently with xfs/for-next
these fail, so removing them fixes it, which is probably what drove
this.

But looking through the patches I'm not sure why they actually are
failing - the updates are logged as part of the inode item, and
nothing in test_attr_replay seems to actually look at log specific
bits?

Only vaguely related, but should we ensure to always clear error
tags after the test runs to ensure they don't leak into other tests?


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