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Date: Sat, 30 Jun 2007 07:28:48 -0700 From: David Brownell <david-b@...bell.net> To: linux-usb-devel@...ts.sourceforge.net, Andrew Morton <akpm@...ux-foundation.org> Cc: Rodolfo Giometti <giometti@...eenne.com>, linux-kernel@...r.kernel.org, Yang-r58472 <LeoLi@...escale.com>, linux-arm-kernel@...ts.arm.linux.org.uk Subject: Re: [linux-usb-devel] [PATCH] PXA27x UDC driver. On Thursday 28 June 2007, Andrew Morton wrote: > > +#undef DISABLE_TEST_MODE > > enabling DISABLE_TEST_MODE seens to enable test mode. Confused. Blame it on Intel. ISTR that early pxa2[156]x silicon had something called "test mode". And a boatload of errata, with a common thread in workarounds: using the "test mode" helped many things work better, although it was neither necessary nor sufficient. If one were to #define DISABLE_TEST_MODE, software could experiment with other workarounds ... and maybe be able to get the documented "double buffering" feature to work. Later silicon stopped documenting "test mode" as such, effectively making certain workarounds become the standard way to use the chip. Which doesn't explain why pxa270 code has pxa2[156]x devel hooks, but explains why pxa2[156]x code wants the hardware "test mode" to be enabled ... except during developer experiments. - Dave - To unsubscribe from this list: send the line "unsubscribe linux-kernel" in the body of a message to majordomo@...r.kernel.org More majordomo info at http://vger.kernel.org/majordomo-info.html Please read the FAQ at http://www.tux.org/lkml/
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