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Message-Id: <1189144341.14370.77.camel@sauron>
Date: Fri, 07 Sep 2007 08:52:21 +0300
From: Artem Bityutskiy <dedekind@...radead.org>
To: bryan.wu@...log.com
Cc: David Woodhouse <dwmw2@...radead.org>,
Thomas Gleixner <tglx@...utronix.de>,
Mike Frysinger <vapier.adi@...il.com>,
Robin Getz <rgetz@...ckfin.uclinux.org>,
linux-mtd@...ts.infradead.org, linux-kernel@...r.kernel.org,
akpm@...ux-foundation.org
Subject: Re: [PATCH try #2] Blackfin on-chip NAND Flash Controller driver
On Tue, 2007-09-04 at 13:57 +0800, Bryan Wu wrote:
> This is the driver for latest Blackfin on-chip nand flash controller
>
> - use nand_chip and mtd_info common nand driver interface
> - provide both PIO and dma operation
> - compiled with ezkit bf548 configuration
> - use hardware 1-bit ECC
> - tested with YAFFS2 and can mount YAFFS2 filesystem as rootfs
>
> ChangeLog from try#1
> - use hweight32() instead of count_bits()
> - replace bf54x with bf5xx and BF54X with BF5XX
> - compare against plat->page_size in 2 cases when enable hardware ECC
>
> Signed-off-by: Bryan Wu <bryan.wu@...log.com>
Bryan,
I'd suggest you to test your NAND driver with the following NAND tests:
git://git.infradead.org/~ahunter/nand-tests.git
(http://git.infradead.org/?p=users/ahunter/nand-tests.git;a=summary)
You may want to avoid the torture test, but it is useful to run it with
limited amount of erase cycles to make sure your flash/driver survives
really high I/O load.For example, we caught occasional DMA transfer
problems while running the torture test for few days.
--
Best regards,
Artem Bityutskiy (Битюцкий Артём)
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