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Message-ID: <tip-20bf062c6575e162ede00308ca3a5714ca112009@git.kernel.org>
Date: Mon, 18 Feb 2013 08:23:51 -0800
From: tip-bot for Alexander Holler <tipbot@...or.com>
To: linux-tip-commits@...r.kernel.org
Cc: linux-kernel@...r.kernel.org, hpa@...or.com, mingo@...nel.org,
yinghai@...nel.org, a.p.zijlstra@...llo.nl,
torvalds@...ux-foundation.org, holler@...oftware.de,
akpm@...ux-foundation.org, tglx@...utronix.de
Subject: [tip:x86/debug] x86/memtest: Shorten time for tests
Commit-ID: 20bf062c6575e162ede00308ca3a5714ca112009
Gitweb: http://git.kernel.org/tip/20bf062c6575e162ede00308ca3a5714ca112009
Author: Alexander Holler <holler@...oftware.de>
AuthorDate: Sat, 16 Feb 2013 16:38:17 +0100
Committer: Ingo Molnar <mingo@...nel.org>
CommitDate: Mon, 18 Feb 2013 09:28:42 +0100
x86/memtest: Shorten time for tests
By just reversing the order memtest is using the test patterns,
an additional round to zero the memory is not necessary.
This might save up to a second or even more for setups which are
doing tests on every boot.
Signed-off-by: Alexander Holler <holler@...oftware.de>
Cc: Yinghai Lu <yinghai@...nel.org>
Cc: Linus Torvalds <torvalds@...ux-foundation.org>
Cc: Andrew Morton <akpm@...ux-foundation.org>
Cc: Peter Zijlstra <a.p.zijlstra@...llo.nl>
Cc: Thomas Gleixner <tglx@...utronix.de>
Link: http://lkml.kernel.org/r/1361029097-8308-1-git-send-email-holler@ahsoftware.de
Signed-off-by: Ingo Molnar <mingo@...nel.org>
---
arch/x86/mm/memtest.c | 10 ++--------
1 file changed, 2 insertions(+), 8 deletions(-)
diff --git a/arch/x86/mm/memtest.c b/arch/x86/mm/memtest.c
index c80b9fb..8dabbed 100644
--- a/arch/x86/mm/memtest.c
+++ b/arch/x86/mm/memtest.c
@@ -9,6 +9,7 @@
#include <linux/memblock.h>
static u64 patterns[] __initdata = {
+ /* The first entry has to be 0 to leave memtest with zeroed memory */
0,
0xffffffffffffffffULL,
0x5555555555555555ULL,
@@ -110,15 +111,8 @@ void __init early_memtest(unsigned long start, unsigned long end)
return;
printk(KERN_INFO "early_memtest: # of tests: %d\n", memtest_pattern);
- for (i = 0; i < memtest_pattern; i++) {
+ for (i = memtest_pattern-1; i < UINT_MAX; --i) {
idx = i % ARRAY_SIZE(patterns);
do_one_pass(patterns[idx], start, end);
}
-
- if (idx > 0) {
- printk(KERN_INFO "early_memtest: wipe out "
- "test pattern from memory\n");
- /* additional test with pattern 0 will do this */
- do_one_pass(0, start, end);
- }
}
--
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