linux-kernel - Re: [PATCH] drm/exynos: dp: Fix panel and bridge lookup logic

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Message-id: <56B88C33.8060808@samsung.com>
Date:	Mon, 08 Feb 2016 13:38:11 +0100
From:	Marek Szyprowski <m.szyprowski@...sung.com>
To:	Javier Martinez Canillas <javier@....samsung.com>,
	linux-kernel@...r.kernel.org, Inki Dae <inki.dae@...sung.com>
Cc:	Kukjin Kim <kgene@...nel.org>,
	Krzysztof Kozlowski <k.kozlowski@...sung.com>,
	Seung-Woo Kim <sw0312.kim@...sung.com>,
	dri-devel@...ts.freedesktop.org, linux-samsung-soc@...r.kernel.org,
	Kyungmin Park <kyungmin.park@...sung.com>,
	Jingoo Han <jingoohan1@...il.com>,
	David Airlie <airlied@...ux.ie>,
	Joonyoung Shim <jy0922.shim@...sung.com>,
	linux-arm-kernel@...ts.infradead.org
Subject: Re: [PATCH] drm/exynos: dp: Fix panel and bridge lookup logic

Hi Javier,

On 2016-02-08 13:03, Javier Martinez Canillas wrote:
> Hello Inki,
>
> On 01/29/2016 12:09 PM, Javier Martinez Canillas wrote:
>> Commit a9fa852886fd ("drm/exynos: dp: add of_graph dt binding support
>> for panel") made the Exynos DP DT binding more consistent since the OF
>> graph could be used to lookup either a panel or a bridge device node.
>>
>> Before that commit, a panel would be looked up using a phandle and a
>> bridge using the OF graph which made the DT binding not consistent.
>>
>> But the patch broke the later case since not finding a panel dev node
>> would cause the driver's to do a probe deferral instead of attempting
>> to lookup a bridge device node associated with the remote endpoint.
>>
>> So instead of returning a -EPROBE_DEFER if a panel is not found, check
>> if there's a bridge and only do a probe deferral if both aren't found.
>>
>> Fixes: a9fa852886fd ("drm/exynos: dp: add of_graph dt binding support 
>> for panel")
>> Signed-off-by: Javier Martinez Canillas <javier@....samsung.com>
>>
>
> Any comments about this patch? It is needed to have display working on
> machines with a bridge chip again so it should be pushed to -rc ASAP.

Please check v4.5-rc3, this patch is already merged there.

Best regards
-- 
Marek Szyprowski, PhD
Samsung R&D Institute Poland