linux-kernel - Re: [PATCH][next] hwrng: exynos: check for -ve error return from readl_poll

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Date:   Mon, 29 Jan 2018 14:24:00 +0100
From:   Łukasz Stelmach <l.stelmach@...sung.com>
To:     Colin King <colin.king@...onical.com>
Cc:     Matt Mackall <mpm@...enic.com>,
        Herbert Xu <herbert@...dor.apana.org.au>,
        Arnd Bergmann <arnd@...db.de>,
        Greg Kroah-Hartman <gregkh@...uxfoundation.org>,
        Kukjin Kim <kgene@...nel.org>,
        Krzysztof Kozlowski <krzk@...nel.org>,
        linux-samsung-soc@...r.kernel.org, linux-crypto@...r.kernel.org,
        linux-arm-kernel@...ts.infradead.org,
        kernel-janitors@...r.kernel.org, linux-kernel@...r.kernel.org
Subject: Re: [PATCH][next] hwrng: exynos: check for -ve error return from
 readl_poll_timeout

It was <2018-01-12 pią 17:30>, when Colin King wrote:
> From: Colin Ian King <colin.king@...onical.com>
>
> Currently, the return from readl_poll_timeout is being assigned to
> a u32 and this is being checked for a -ve return which is always
> false since a u32 cannot be less than zero.  Fix this by changing
> val to an int so that error returns can be correctly detected.
>
> Detected by CoverityScan, CID#1463776 ("Logically dead code")
>
> Fixes: 6cd225cc5d8a ("hwrng: exynos - add Samsung Exynos True RNG driver")
> Signed-off-by: Colin Ian King <colin.king@...onical.com>
> ---
>  drivers/char/hw_random/exynos-trng.c | 2 +-
>  1 file changed, 1 insertion(+), 1 deletion(-)
>
> diff --git a/drivers/char/hw_random/exynos-trng.c b/drivers/char/hw_random/exynos-trng.c
> index 34d6f51ecbee..f4643e3ec346 100644
> --- a/drivers/char/hw_random/exynos-trng.c
> +++ b/drivers/char/hw_random/exynos-trng.c
> @@ -55,7 +55,7 @@ static int exynos_trng_do_read(struct hwrng *rng, void *data, size_t max,
>  			       bool wait)
>  {
>  	struct exynos_trng_dev *trng;
> -	u32 val;
> +	int val;
>  
>  	max = min_t(size_t, max, (EXYNOS_TRNG_FIFO_LEN * 4));

Fixed.

https://git.kernel.org/pub/scm/linux/kernel/git/herbert/cryptodev-2.6.git/commit/?id=a8bc71d4960391f732ec0307ebd69e4a25aaf4d3

-- 
Łukasz Stelmach
Samsung R&D Institute Poland
Samsung Electronics

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