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Message-Id: <20180509193355.49466-4-giulio.benetti@micronovasrl.com>
Date: Wed, 9 May 2018 21:33:55 +0200
From: Giulio Benetti <giulio.benetti@...ronovasrl.com>
To: a.zummo@...ertech.it, alexandre.belloni@...tlin.com
Cc: robh+dt@...nel.org, mark.rutland@....com,
linux-rtc@...r.kernel.org, devicetree@...r.kernel.org,
linux-kernel@...r.kernel.org,
Giulio Benetti <giulio.benetti@...ronovasrl.com>
Subject: [PATCH v3 4/4] rtc: ds1307: add freq_test sysfs attribute to check tick on m41txx
On m41txx you can enable open-drain OUT pin to check if offset is ok.
Enabling OUT pin with freq_test attribute, OUT pin will tick 512 times
faster than 1s tick base.
Enable or Disable FT bit on CONTROL register if freq_test is 1 or 0.
Signed-off-by: Giulio Benetti <giulio.benetti@...ronovasrl.com>
---
V2 => V3: export freq_test on sysfs only if supported(m41txx series)
drivers/rtc/rtc-ds1307.c | 107 +++++++++++++++++++++++++++++++++++++++
1 file changed, 107 insertions(+)
diff --git a/drivers/rtc/rtc-ds1307.c b/drivers/rtc/rtc-ds1307.c
index 33895668b363..79206bf21018 100644
--- a/drivers/rtc/rtc-ds1307.c
+++ b/drivers/rtc/rtc-ds1307.c
@@ -1042,6 +1042,109 @@ static int m41txx_rtc_set_offset(struct device *dev, long offset)
return regmap_write(ds1307->regmap, M41TXX_REG_CONTROL, ctrl_reg);
}
+static ssize_t freq_test_store(struct device *dev,
+ struct device_attribute *attr,
+ const char *buf, size_t count)
+{
+ struct ds1307 *ds1307 = dev_get_drvdata(dev);
+ unsigned long freq_test = 0;
+ unsigned int ctrl_reg;
+ int retval;
+
+ retval = kstrtoul(buf, 10, &freq_test);
+ if ((retval < 0) || (retval > 1)) {
+ dev_err(dev, "Failed to store RTC Frequency Test attribute\n");
+ return -EINVAL;
+ }
+
+ regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg);
+
+ if (freq_test)
+ ctrl_reg |= M41TXX_BIT_FT;
+ else
+ ctrl_reg &= ~M41TXX_BIT_FT;
+
+ retval = regmap_write(ds1307->regmap, M41TXX_REG_CONTROL, ctrl_reg);
+
+ return retval ? retval : count;
+}
+
+static ssize_t freq_test_show(struct device *dev,
+ struct device_attribute *attr, char *buf)
+{
+ struct ds1307 *ds1307 = dev_get_drvdata(dev);
+ int freq_test = 0;
+ unsigned int ctrl_reg;
+
+ regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg);
+
+ if (ctrl_reg & M41TXX_BIT_FT)
+ freq_test = true;
+ else
+ freq_test = false;
+
+ if ((freq_test < 0) || (freq_test > 1)) {
+ dev_err(dev, "Failed to read RTC Frequency Test\n");
+ sprintf(buf, "0\n");
+ return freq_test;
+ }
+
+ return sprintf(buf, "%d\n", freq_test);
+}
+
+static DEVICE_ATTR_RW(freq_test);
+
+static struct attribute *rtc_freq_test_attrs[] = {
+ &dev_attr_freq_test.attr,
+ NULL,
+};
+
+static const struct attribute_group rtc_freq_test_attr_group = {
+ .attrs = rtc_freq_test_attrs,
+};
+
+static void rtc_calib_remove_sysfs_group(void *_dev)
+{
+ struct device *dev = _dev;
+
+ sysfs_remove_group(&dev->kobj, &rtc_freq_test_attr_group);
+}
+
+static int ds1307_add_frequency_test(struct ds1307 *ds1307)
+{
+ int err = 0;
+
+ switch (ds1307->type) {
+ case m41t0:
+ case m41t00:
+ case m41t11:
+ /* Export sysfs entries */
+ err = sysfs_create_group(&(ds1307->dev)->kobj,
+ &rtc_freq_test_attr_group);
+ if (err) {
+ dev_err(ds1307->dev,
+ "Failed to create sysfs group: %d\n",
+ err);
+ return err;
+ }
+
+ err = devm_add_action_or_reset(ds1307->dev,
+ rtc_calib_remove_sysfs_group,
+ ds1307->dev);
+ if (err) {
+ dev_err(ds1307->dev,
+ "Failed to add sysfs cleanup action: %d\n",
+ err);
+ return err;
+ }
+ break;
+ default:
+ break;
+ }
+
+ return err;
+}
+
/*----------------------------------------------------------------------*/
static int ds1307_nvram_read(void *priv, unsigned int offset, void *val,
@@ -1783,6 +1886,10 @@ static int ds1307_probe(struct i2c_client *client,
if (err)
return err;
+ err = ds1307_add_frequency_test(ds1307);
+ if (err)
+ return err;
+
if (chip->nvram_size) {
struct nvmem_config nvmem_cfg = {
.name = "ds1307_nvram",
--
2.17.0
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