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Message-ID: <0101cc06-acec-b4ec-3f9d-6a2b4a904390@micronovasrl.com>
Date: Wed, 16 May 2018 23:09:21 +0200
From: Giulio Benetti <giulio.benetti@...ronovasrl.com>
To: a.zummo@...ertech.it, alexandre.belloni@...tlin.com
Cc: robh+dt@...nel.org, mark.rutland@....com,
linux-rtc@...r.kernel.org, devicetree@...r.kernel.org,
linux-kernel@...r.kernel.org, andy.shevchenko@...il.com
Subject: Re: [PATCH v6 4/4] rtc: ds1307: add frequency_test_enable sysfs
attribute to check tick on m41txx
Sorry, no V5 => V6 changelog, I resubmit.
Il 16/05/2018 23:07, Giulio Benetti ha scritto:
> On m41txx you can enable open-drain OUT pin to check if offset is ok.
> Enabling OUT pin with frequency_test_enable attribute, OUT pin will tick
> 512 times faster than 1s tick base.
>
> Enable or Disable FT bit on CONTROL register if freq_test is 1 or 0.
>
> Signed-off-by: Giulio Benetti <giulio.benetti@...ronovasrl.com>
> ---
> drivers/rtc/rtc-ds1307.c | 96 ++++++++++++++++++++++++++++++++++++++++
> 1 file changed, 96 insertions(+)
>
> diff --git a/drivers/rtc/rtc-ds1307.c b/drivers/rtc/rtc-ds1307.c
> index 2797d01bfa1d..b2e87845d860 100644
> --- a/drivers/rtc/rtc-ds1307.c
> +++ b/drivers/rtc/rtc-ds1307.c
> @@ -1053,6 +1053,96 @@ static int m41txx_rtc_set_offset(struct device *dev, long offset)
> ctrl_reg);
> }
>
> +static ssize_t frequency_test_enable_store(struct device *dev,
> + struct device_attribute *attr,
> + const char *buf, size_t count)
> +{
> + struct ds1307 *ds1307 = dev_get_drvdata(dev);
> + bool freq_test_en = 0;
> + int ret;
> +
> + ret = kstrtobool(buf, &freq_test_en);
> + if (ret == -EINVAL) {
> + dev_err(dev, "Failed to store RTC Frequency Test attribute\n");
> + return ret;
> + }
> +
> + regmap_update_bits(ds1307->regmap, M41TXX_REG_CONTROL, M41TXX_BIT_FT,
> + freq_test_en ? M41TXX_BIT_FT : 0);
> +
> + return count;
> +}
> +
> +static ssize_t frequency_test_enable_show(struct device *dev,
> + struct device_attribute *attr,
> + char *buf)
> +{
> + struct ds1307 *ds1307 = dev_get_drvdata(dev);
> + unsigned int ctrl_reg;
> +
> + regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg);
> +
> + if (ctrl_reg & M41TXX_BIT_FT)
> + return scnprintf(buf, PAGE_SIZE, "on\n");
> + else
> + return scnprintf(buf, PAGE_SIZE, "off\n");
> +}
> +
> +static DEVICE_ATTR_RW(frequency_test_enable);
> +
> +static struct attribute *rtc_freq_test_attrs[] = {
> + &dev_attr_frequency_test_enable.attr,
> + NULL,
> +};
> +
> +static const struct attribute_group rtc_freq_test_attr_group = {
> + .attrs = rtc_freq_test_attrs,
> +};
> +
> +static void rtc_calib_remove_sysfs_group(void *_dev)
> +{
> + struct device *dev = _dev;
> +
> + sysfs_remove_group(&dev->kobj, &rtc_freq_test_attr_group);
> +}
> +
> +static int ds1307_add_frequency_test(struct ds1307 *ds1307)
> +{
> + int err = 0;
> +
> + switch (ds1307->type) {
> + case m41t0:
> + case m41t00:
> + case m41t11:
> + /* Export sysfs entries */
> + err = sysfs_create_group(&(ds1307->dev)->kobj,
> + &rtc_freq_test_attr_group);
> + if (err) {
> + dev_err(ds1307->dev,
> + "Failed to create sysfs group: %d\n",
> + err);
> + return err;
> + }
> +
> + err = devm_add_action_or_reset(ds1307->dev,
> + rtc_calib_remove_sysfs_group,
> + ds1307->dev);
> + if (err) {
> + dev_err(ds1307->dev,
> + "Failed to add sysfs cleanup action: %d\n",
> + err);
> + sysfs_remove_group(&(ds1307->dev)->kobj,
> + &rtc_freq_test_attr_group);
> + return err;
> + }
> + break;
> + default:
> + break;
> + }
> +
> + return err;
> +}
> +
> /*----------------------------------------------------------------------*/
>
> static int ds1307_nvram_read(void *priv, unsigned int offset, void *val,
> @@ -1794,6 +1884,12 @@ static int ds1307_probe(struct i2c_client *client,
> if (err)
> return err;
>
> + err = ds1307_add_frequency_test(ds1307);
> + if (err) {
> + rtc_device_unregister(ds1307->rtc);
> + return err;
> + }
> +
> if (chip->nvram_size) {
> struct nvmem_config nvmem_cfg = {
> .name = "ds1307_nvram",
>
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