lists.openwall.net   lists  /  announce  owl-users  owl-dev  john-users  john-dev  passwdqc-users  yescrypt  popa3d-users  /  oss-security  kernel-hardening  musl  sabotage  tlsify  passwords  /  crypt-dev  xvendor  /  Bugtraq  Full-Disclosure  linux-kernel  linux-netdev  linux-ext4  linux-hardening  linux-cve-announce  PHC 
Open Source and information security mailing list archives
 
Hash Suite: Windows password security audit tool. GUI, reports in PDF.
[<prev] [next>] [<thread-prev] [thread-next>] [day] [month] [year] [list]
Date:   Wed, 29 Aug 2018 14:04:05 +0800
From:   Baolin Wang <baolin.wang@...aro.org>
To:     jic23@...nel.org, robh+dt@...nel.org, mark.rutland@....com
Cc:     knaack.h@....de, lars@...afoo.de, pmeerw@...erw.net,
        freeman.liu@...eadtrum.com, broonie@...nel.org,
        baolin.wang@...aro.org, devicetree@...r.kernel.org,
        linux-iio@...r.kernel.org, linux-kernel@...r.kernel.org
Subject: [PATCH v2 2/2] iio: adc: sc27xx: Add ADC scale calibration

This patch adds support to read calibration values from the eFuse
controller to calibrate the ADC channel scales, which can make ADC
sample data more accurate.

Signed-off-by: Baolin Wang <baolin.wang@...aro.org>
---
Changes from v1:
 - Use nvmem_cell_read() instead of nvmem_cell_read_u32().
---
 .../bindings/iio/adc/sprd,sc27xx-adc.txt           |    4 ++
 drivers/iio/adc/sc27xx_adc.c                       |   74 +++++++++++++++++++-
 2 files changed, 75 insertions(+), 3 deletions(-)

diff --git a/Documentation/devicetree/bindings/iio/adc/sprd,sc27xx-adc.txt b/Documentation/devicetree/bindings/iio/adc/sprd,sc27xx-adc.txt
index 8aad960..b4daa15 100644
--- a/Documentation/devicetree/bindings/iio/adc/sprd,sc27xx-adc.txt
+++ b/Documentation/devicetree/bindings/iio/adc/sprd,sc27xx-adc.txt
@@ -12,6 +12,8 @@ Required properties:
 - interrupts: The interrupt number for the ADC device.
 - #io-channel-cells: Number of cells in an IIO specifier.
 - hwlocks: Reference to a phandle of a hwlock provider node.
+- nvmem-cells: A phandle to the calibration cells provided by eFuse device.
+- nvmem-cell-names: Should be "big_scale_calib", "small_scale_calib".
 
 Example:
 
@@ -32,5 +34,7 @@ Example:
 			interrupts = <0 IRQ_TYPE_LEVEL_HIGH>;
 			#io-channel-cells = <1>;
 			hwlocks = <&hwlock 4>;
+			nvmem-cells = <&adc_big_scale>, <&adc_small_scale>;
+			nvmem-cell-names = "big_scale_calib", "small_scale_calib";
 		};
 	};
diff --git a/drivers/iio/adc/sc27xx_adc.c b/drivers/iio/adc/sc27xx_adc.c
index 153c311..7940b23 100644
--- a/drivers/iio/adc/sc27xx_adc.c
+++ b/drivers/iio/adc/sc27xx_adc.c
@@ -5,10 +5,12 @@
 #include <linux/iio/iio.h>
 #include <linux/interrupt.h>
 #include <linux/module.h>
+#include <linux/nvmem-consumer.h>
 #include <linux/of.h>
 #include <linux/of_device.h>
 #include <linux/platform_device.h>
 #include <linux/regmap.h>
+#include <linux/slab.h>
 
 /* PMIC global registers definition */
 #define SC27XX_MODULE_EN		0xc08
@@ -87,16 +89,73 @@ struct sc27xx_adc_linear_graph {
  * should use the small-scale graph, and if more than 1.2v, we should use the
  * big-scale graph.
  */
-static const struct sc27xx_adc_linear_graph big_scale_graph = {
+static struct sc27xx_adc_linear_graph big_scale_graph = {
 	4200, 3310,
 	3600, 2832,
 };
 
-static const struct sc27xx_adc_linear_graph small_scale_graph = {
+static struct sc27xx_adc_linear_graph small_scale_graph = {
 	1000, 3413,
 	100, 341,
 };
 
+static const struct sc27xx_adc_linear_graph big_scale_graph_calib = {
+	4200, 856,
+	3600, 733,
+};
+
+static const struct sc27xx_adc_linear_graph small_scale_graph_calib = {
+	1000, 833,
+	100, 80,
+};
+
+static int sc27xx_adc_get_calib_data(u32 calib_data, int calib_adc)
+{
+	return ((calib_data & 0xff) + calib_adc - 128) * 4;
+}
+
+static int sc27xx_adc_scale_calibration(struct sc27xx_adc_data *data,
+					bool big_scale)
+{
+	const struct sc27xx_adc_linear_graph *calib_graph;
+	struct sc27xx_adc_linear_graph *graph;
+	struct nvmem_cell *cell;
+	const char *cell_name;
+	u32 calib_data = 0;
+	void *buf;
+	size_t len;
+
+	if (big_scale) {
+		calib_graph = &big_scale_graph_calib;
+		graph = &big_scale_graph;
+		cell_name = "big_scale_calib";
+	} else {
+		calib_graph = &small_scale_graph_calib;
+		graph = &small_scale_graph;
+		cell_name = "small_scale_calib";
+	}
+
+	cell = nvmem_cell_get(data->dev, cell_name);
+	if (IS_ERR(cell))
+		return PTR_ERR(cell);
+
+	buf = nvmem_cell_read(cell, &len);
+	nvmem_cell_put(cell);
+
+	if (IS_ERR(buf))
+		return PTR_ERR(buf);
+
+	memcpy(&calib_data, buf, min(len, sizeof(u32)));
+
+	/* Only need to calibrate the adc values in the linear graph. */
+	graph->adc0 = sc27xx_adc_get_calib_data(calib_data, calib_graph->adc0);
+	graph->adc1 = sc27xx_adc_get_calib_data(calib_data >> 8,
+						calib_graph->adc1);
+
+	kfree(buf);
+	return 0;
+}
+
 static int sc27xx_adc_get_ratio(int channel, int scale)
 {
 	switch (channel) {
@@ -209,7 +268,7 @@ static void sc27xx_adc_volt_ratio(struct sc27xx_adc_data *data,
 	*div_denominator = ratio & SC27XX_RATIO_DENOMINATOR_MASK;
 }
 
-static int sc27xx_adc_to_volt(const struct sc27xx_adc_linear_graph *graph,
+static int sc27xx_adc_to_volt(struct sc27xx_adc_linear_graph *graph,
 			      int raw_adc)
 {
 	int tmp;
@@ -390,6 +449,15 @@ static int sc27xx_adc_enable(struct sc27xx_adc_data *data)
 	if (ret)
 		goto disable_clk;
 
+	/* ADC channel scales' calibration from nvmem device */
+	ret = sc27xx_adc_scale_calibration(data, true);
+	if (ret)
+		goto disable_clk;
+
+	ret = sc27xx_adc_scale_calibration(data, false);
+	if (ret)
+		goto disable_clk;
+
 	return 0;
 
 disable_clk:
-- 
1.7.9.5

Powered by blists - more mailing lists

Powered by Openwall GNU/*/Linux Powered by OpenVZ