linux-kernel - Re: [PATCH v2] video: fbdev: Mark expected switch fall-through

lists.openwall.net		lists / announce owl-users owl-dev john-users john-dev passwdqc-users yescrypt popa3d-users / oss-security kernel-hardening musl sabotage tlsify passwords / crypt-dev xvendor / Bugtraq Full-Disclosure linux-kernel linux-netdev linux-ext4 linux-hardening linux-cve-announce PHC
Open Source and information security mailing list archives

Hash Suite: Windows password security audit tool. GUI, reports in PDF.

[<prev] [next>] [<thread-prev] [day] [month] [year] [list]

Message-ID: <270684a4-ce22-ebb8-73a8-c004674c8f5d@samsung.com>
Date:   Mon, 19 Aug 2019 16:04:06 +0200
From:   Bartlomiej Zolnierkiewicz <b.zolnierkie@...sung.com>
To:     Anders Roxell <anders.roxell@...aro.org>
Cc:     dri-devel@...ts.freedesktop.org, linux-fbdev@...r.kernel.org,
        linux-kernel@...r.kernel.org, gustavo@...eddedor.com
Subject: Re: [PATCH v2] video: fbdev: Mark expected switch fall-through


On 7/30/19 5:25 PM, Anders Roxell wrote:
> Now that -Wimplicit-fallthrough is passed to GCC by default, the
> following warnings shows up:
> 
> ../drivers/video/fbdev/sh_mobile_lcdcfb.c: In function ‘sh_mobile_lcdc_channel_fb_init’:
> ../drivers/video/fbdev/sh_mobile_lcdcfb.c:2086:22: warning: this statement may fall
>  through [-Wimplicit-fallthrough=]
>    info->fix.ypanstep = 2;
>    ~~~~~~~~~~~~~~~~~~~^~~
> ../drivers/video/fbdev/sh_mobile_lcdcfb.c:2087:2: note: here
>   case V4L2_PIX_FMT_NV16:
>   ^~~~
> ../drivers/video/fbdev/sh_mobile_lcdcfb.c: In function ‘sh_mobile_lcdc_overlay_fb_init’:
> ../drivers/video/fbdev/sh_mobile_lcdcfb.c:1596:22: warning: this statement may fall
>  through [-Wimplicit-fallthrough=]
>    info->fix.ypanstep = 2;
>    ~~~~~~~~~~~~~~~~~~~^~~
> ../drivers/video/fbdev/sh_mobile_lcdcfb.c:1597:2: note: here
>   case V4L2_PIX_FMT_NV16:
>   ^~~~
> 
> Rework to address a warnings due to the enablement of
> -Wimplicit-fallthrough.
> 
> Signed-off-by: Anders Roxell <anders.roxell@...aro.org>

Patch queued for v5.4, thanks.

Best regards,
--
Bartlomiej Zolnierkiewicz
Samsung R&D Institute Poland
Samsung Electronics