linux-kernel - [PATCH 4/5] dt-bindings: power: sc27xx: Add a new property to describe the real resistance of coulomb counter chip

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Message-Id: <00202f739348258555dcc40982c330542ac61863.1572245011.git.baolin.wang@linaro.org>
Date:   Mon, 28 Oct 2019 15:19:00 +0800
From:   Baolin Wang <baolin.wang@...aro.org>
To:     sre@...nel.org, robh+dt@...nel.org, mark.rutland@....com
Cc:     linux-pm@...r.kernel.org, devicetree@...r.kernel.org,
        linux-kernel@...r.kernel.org, yuanjiang.yu@...soc.com,
        baolin.wang@...aro.org, baolin.wang7@...il.com,
        zhang.lyra@...il.com, orsonzhai@...il.com
Subject: [PATCH 4/5] dt-bindings: power: sc27xx: Add a new property to describe the real resistance of coulomb counter chip

Add a new property to describe the real resistance of coulomb counter chip,
which is used to calibrate the accuracy of the coulomb counter chip.

Signed-off-by: Baolin Wang <baolin.wang@...aro.org>
---
 .../devicetree/bindings/power/supply/sc27xx-fg.txt |    2 ++
 1 file changed, 2 insertions(+)

diff --git a/Documentation/devicetree/bindings/power/supply/sc27xx-fg.txt b/Documentation/devicetree/bindings/power/supply/sc27xx-fg.txt
index 0a5705b..fc042d0 100644
--- a/Documentation/devicetree/bindings/power/supply/sc27xx-fg.txt
+++ b/Documentation/devicetree/bindings/power/supply/sc27xx-fg.txt
@@ -13,6 +13,7 @@ Required properties:
 - io-channel-names: Should be "bat-temp" or "charge-vol".
 - nvmem-cells: A phandle to the calibration cells provided by eFuse device.
 - nvmem-cell-names: Should be "fgu_calib".
+- sprd,calib-resistance: Specify the real resistance of coulomb counter chip in micro Ohms.
 - monitored-battery: Phandle of battery characteristics devicetree node.
   See Documentation/devicetree/bindings/power/supply/battery.txt
 
@@ -52,5 +53,6 @@ Example:
 			nvmem-cells = <&fgu_calib>;
 			nvmem-cell-names = "fgu_calib";
 			monitored-battery = <&bat>;
+			sprd,calib-resistance = <21500>;
 		};
 	};
-- 
1.7.9.5