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Message-Id: <20200203161926.755377982@linuxfoundation.org>
Date:   Mon,  3 Feb 2020 16:20:21 +0000
From:   Greg Kroah-Hartman <gregkh@...uxfoundation.org>
To:     linux-kernel@...r.kernel.org
Cc:     Greg Kroah-Hartman <gregkh@...uxfoundation.org>,
        stable@...r.kernel.org, Hayes Wang <hayeswang@...ltek.com>,
        "David S. Miller" <davem@...emloft.net>,
        Sasha Levin <sashal@...nel.org>
Subject: [PATCH 5.4 78/90] r8152: disable test IO for RTL8153B

From: Hayes Wang <hayeswang@...ltek.com>

[ Upstream commit d7f1b59655efb5a285d227c8f9853a98eab5c2fd ]

For RTL8153B with QFN32, disable test IO. Otherwise, it may cause
abnormal behavior for the device randomly.

Signed-off-by: Hayes Wang <hayeswang@...ltek.com>
Signed-off-by: David S. Miller <davem@...emloft.net>
Signed-off-by: Sasha Levin <sashal@...nel.org>
---
 drivers/net/usb/r8152.c | 10 ++++++++++
 1 file changed, 10 insertions(+)

diff --git a/drivers/net/usb/r8152.c b/drivers/net/usb/r8152.c
index 2d3374a373f83..1f61859baa531 100644
--- a/drivers/net/usb/r8152.c
+++ b/drivers/net/usb/r8152.c
@@ -298,6 +298,7 @@
 /* PLA_PHY_PWR */
 #define TX_10M_IDLE_EN		0x0080
 #define PFM_PWM_SWITCH		0x0040
+#define TEST_IO_OFF		BIT(4)
 
 /* PLA_MAC_PWR_CTRL */
 #define D3_CLK_GATED_EN		0x00004000
@@ -4540,6 +4541,15 @@ static void r8153b_init(struct r8152 *tp)
 	ocp_data &= ~PLA_MCU_SPDWN_EN;
 	ocp_write_word(tp, MCU_TYPE_PLA, PLA_MAC_PWR_CTRL3, ocp_data);
 
+	if (tp->version == RTL_VER_09) {
+		/* Disable Test IO for 32QFN */
+		if (ocp_read_byte(tp, MCU_TYPE_PLA, 0xdc00) & BIT(5)) {
+			ocp_data = ocp_read_word(tp, MCU_TYPE_PLA, PLA_PHY_PWR);
+			ocp_data |= TEST_IO_OFF;
+			ocp_write_word(tp, MCU_TYPE_PLA, PLA_PHY_PWR, ocp_data);
+		}
+	}
+
 	set_bit(GREEN_ETHERNET, &tp->flags);
 
 	/* rx aggregation */
-- 
2.20.1



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