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Date:   Tue, 15 Sep 2020 18:42:32 +0100
From:   Lad Prabhakar <prabhakar.mahadev-lad.rj@...renesas.com>
To:     Jacopo Mondi <jacopo@...ndi.org>,
        Sakari Ailus <sakari.ailus@...ux.intel.com>,
        Laurent Pinchart <laurent.pinchart+renesas@...asonboard.com>,
        Mauro Carvalho Chehab <mchehab@...nel.org>
Cc:     linux-media@...r.kernel.org, linux-kernel@...r.kernel.org,
        linux-renesas-soc@...r.kernel.org,
        Biju Das <biju.das.jz@...renesas.com>,
        Lad Prabhakar <prabhakar.mahadev-lad.rj@...renesas.com>,
        Prabhakar <prabhakar.csengg@...il.com>
Subject: [PATCH v5 0/3] media: i2c: ov772x: Enable BT.656 mode and test pattern support

Hi All,

This patch series adds support for BT.656 mode in the ov772x sensor
and also enables color bar test pattern control.

Cheers,
Prabhakar

Changes for v5:
* Put the ep instance back using fwnode_handle_put()
* Renamed BT656 to BT.656
* Correctly handled backward compatibility case falling
  back to parallel mode.

Changes for v4:
* New patch 1/3 to fallback in parallel mode.
* Switched to v4l2_fwnode_endpoint_alloc_parse() for parsing the ep.
* Dropped support for pdat for test pattern control.
* DT documentation patches [1].

Changes for v3:
* Dropped DT binding documentation patch as this is handled by Jacopo.
* Fixed review comments pointed by Jacopo.

[1] https://patchwork.kernel.org/project/
    linux-renesas-soc/list/?series=346809

Lad Prabhakar (3):
  media: i2c: ov772x: Parse endpoint properties
  media: i2c: ov772x: Add support for BT.656 mode
  media: i2c: ov772x: Add test pattern control

 drivers/media/i2c/ov772x.c | 57 +++++++++++++++++++++++++++++++++++++-
 1 file changed, 56 insertions(+), 1 deletion(-)

-- 
2.17.1

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