linux-kernel - Re: [PATCH 4/5] selftests: firmware: Simplify test patterns

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Message-ID: <46b53735-5232-17ef-f8c1-d603aa7739c4@linuxfoundation.org>
Date:   Mon, 25 Apr 2022 13:48:15 -0600
From:   Shuah Khan <skhan@...uxfoundation.org>
To:     Takashi Iwai <tiwai@...e.de>, Luis Chamberlain <mcgrof@...nel.org>
Cc:     Greg Kroah-Hartman <gregkh@...uxfoundation.org>,
        "Rafael J . Wysocki" <rafael@...nel.org>,
        Nick Terrell <terrelln@...com>, Shuah Khan <shuah@...nel.org>,
        linux-kernel@...r.kernel.org, linux-kselftest@...r.kernel.org,
        Shuah Khan <skhan@...uxfoundation.org>
Subject: Re: [PATCH 4/5] selftests: firmware: Simplify test patterns

On 4/21/22 9:29 AM, Takashi Iwai wrote:
> The test patterns are almost same in three sequential tests.
> Make the unified helper function for improving the readability.
> 
> Link: https://lore.kernel.org/all/20210127154939.13288-1-tiwai@suse.de/
> Signed-off-by: Takashi Iwai <tiwai@...e.de>
> ---

Thank you. It helps with maintaining this code easier.

Reviewed-by: Shuah Khan <skhan@...uxfoundation.org>

thanks,
-- Shuah