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Message-Id: <20220810103000.8721-1-dengshaomin@cdjrlc.com>
Date: Wed, 10 Aug 2022 06:30:00 -0400
From: shaomin Deng <dengshaomin@...rlc.com>
To: gregkh@...uxfoundation.org, linux-usb@...r.kernel.org,
linux-kernel@...r.kernel.org
Cc: shaomin Deng <dengshaomin@...rlc.com>
Subject: [PATCH] usb: usbtest: Fix typo in comments
Delete the rebundant word "with" in comments.
Signed-off-by: shaomin Deng <dengshaomin@...rlc.com>
---
drivers/usb/misc/usbtest.c | 2 +-
1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/drivers/usb/misc/usbtest.c b/drivers/usb/misc/usbtest.c
index 150090ee4ec1..ac0d75ac2d2f 100644
--- a/drivers/usb/misc/usbtest.c
+++ b/drivers/usb/misc/usbtest.c
@@ -2638,7 +2638,7 @@ usbtest_do_ioctl(struct usb_interface *intf, struct usbtest_param_32 *param)
* different busses) to use when testing, and allocate one thread per
* test. So discovery is simplified, and we have no device naming issues.
*
- * Don't use these only as stress/load tests. Use them along with with
+ * Don't use these only as stress/load tests. Use them along with
* other USB bus activity: plugging, unplugging, mousing, mp3 playback,
* video capture, and so on. Run different tests at different times, in
* different sequences. Nothing here should interact with other devices,
--
2.35.1
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