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Date:   Wed, 19 Oct 2022 10:29:10 +0200
From:   Greg Kroah-Hartman <gregkh@...uxfoundation.org>
To:     linux-kernel@...r.kernel.org
Cc:     Greg Kroah-Hartman <gregkh@...uxfoundation.org>,
        stable@...r.kernel.org,
        Jonathan Cameron <Jonathan.Cameron@...wei.com>,
        Andy Shevchenko <andy.shevchenko@...il.com>,
        Sasha Levin <sashal@...nel.org>
Subject: [PATCH 6.0 463/862] iio: ABI: Fix wrong format of differential capacitance channel ABI.

From: Jonathan Cameron <Jonathan.Cameron@...wei.com>

[ Upstream commit 1efc41035f1841acf0af2bab153158e27ce94f10 ]

in_ only occurs once in these attributes.

Fixes: 0baf29d658c7 ("staging:iio:documentation Add abi docs for capacitance adcs.")
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@...wei.com>
Reviewed-by: Andy Shevchenko <andy.shevchenko@...il.com>
Link: https://lore.kernel.org/r/20220626122938.582107-3-jic23@kernel.org
Signed-off-by: Sasha Levin <sashal@...nel.org>
---
 Documentation/ABI/testing/sysfs-bus-iio | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index e81ba6f5e1c8..6e1b925f30bf 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -196,7 +196,7 @@ Description:
 		Raw capacitance measurement from channel Y. Units after
 		application of scale and offset are nanofarads.
 
-What:		/sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw
+What:		/sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw
 KernelVersion:	3.2
 Contact:	linux-iio@...r.kernel.org
 Description:
-- 
2.35.1



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