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Message-ID: <bdf5705c-9b79-80fa-a31e-6317e4f2c0bf@intel.com>
Date: Thu, 16 Mar 2023 12:44:06 -0700
From: "Joseph, Jithu" <jithu.joseph@...el.com>
To: Hans de Goede <hdegoede@...hat.com>,
"Luck, Tony" <tony.luck@...el.com>,
"markgross@...nel.org" <markgross@...nel.org>
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"Jimenez Gonzalez, Athenas" <athenas.jimenez.gonzalez@...el.com>,
"Mehta, Sohil" <sohil.mehta@...el.com>
Subject: Re: [PATCH v3 4/8] platform/x86/intel/ifs: Introduce Array Scan test
to IFS
On 3/16/2023 2:50 AM, Hans de Goede wrote:
> Ok I see, lets go with 1 intel_ifs device per test-type then.
>
> If I understood things correctly esp. also with the /lib/firmware path then the <N> in intel_ifs_<N> basically specifies the test-type, correct ?
>
Correct
> If I have that correct please add this to the ABI documentation in the form of a list with
>
> intel_ifs_<N> <-> test-type
>
> mappings. And also add documentation to each attribute for which test-types the attribute is valid (this can be "all" for e.g. status, to avoid churn when adding more test types).
Will do. Thanks for the review comments
Jithu
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