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Message-Id: <20230509060449.1151113-2-mmyangfl@gmail.com>
Date: Tue, 9 May 2023 14:04:44 +0800
From: David Yang <mmyangfl@...il.com>
To: linux-phy@...ts.infradead.org
Cc: David Yang <mmyangfl@...il.com>, Vinod Koul <vkoul@...nel.org>,
Kishon Vijay Abraham I <kishon@...nel.org>,
linux-kernel@...r.kernel.org
Subject: [PATCH v2 1/2] phy: hisilicon: Add inno-usb2-phy driver for Hi3798MV100
Adopt existing phy-hisi-inno-usb2 driver to Hi3798MV100, with a slightly
different TEST register convention.
Signed-off-by: David Yang <mmyangfl@...il.com>
---
drivers/phy/hisilicon/phy-hisi-inno-usb2.c | 62 ++++++++++++++++------
1 file changed, 46 insertions(+), 16 deletions(-)
diff --git a/drivers/phy/hisilicon/phy-hisi-inno-usb2.c b/drivers/phy/hisilicon/phy-hisi-inno-usb2.c
index b133ae06757a..15dafe359552 100644
--- a/drivers/phy/hisilicon/phy-hisi-inno-usb2.c
+++ b/drivers/phy/hisilicon/phy-hisi-inno-usb2.c
@@ -9,7 +9,7 @@
#include <linux/delay.h>
#include <linux/io.h>
#include <linux/module.h>
-#include <linux/platform_device.h>
+#include <linux/of_device.h>
#include <linux/phy/phy.h>
#include <linux/reset.h>
@@ -20,12 +20,25 @@
#define PHY_CLK_STABLE_TIME 2 /* unit:ms */
#define UTMI_RST_COMPLETE_TIME 2 /* unit:ms */
#define POR_RST_COMPLETE_TIME 300 /* unit:us */
+
+#define PHY_TYPE_0 0
+#define PHY_TYPE_1 1
+
#define PHY_TEST_DATA GENMASK(7, 0)
-#define PHY_TEST_ADDR GENMASK(15, 8)
-#define PHY_TEST_PORT GENMASK(18, 16)
-#define PHY_TEST_WREN BIT(21)
-#define PHY_TEST_CLK BIT(22) /* rising edge active */
-#define PHY_TEST_RST BIT(23) /* low active */
+#define PHY_TEST_ADDR_OFFSET 8
+#define PHY0_TEST_ADDR GENMASK(15, 8)
+#define PHY0_TEST_PORT_OFFSET 16
+#define PHY0_TEST_PORT GENMASK(18, 16)
+#define PHY0_TEST_WREN BIT(21)
+#define PHY0_TEST_CLK BIT(22) /* rising edge active */
+#define PHY0_TEST_RST BIT(23) /* low active */
+#define PHY1_TEST_ADDR GENMASK(11, 8)
+#define PHY1_TEST_PORT_OFFSET 12
+#define PHY1_TEST_PORT BIT(12)
+#define PHY1_TEST_WREN BIT(13)
+#define PHY1_TEST_CLK BIT(14) /* rising edge active */
+#define PHY1_TEST_RST BIT(15) /* low active */
+
#define PHY_CLK_ENABLE BIT(2)
struct hisi_inno_phy_port {
@@ -37,6 +50,7 @@ struct hisi_inno_phy_priv {
void __iomem *mmio;
struct clk *ref_clk;
struct reset_control *por_rst;
+ unsigned int type;
struct hisi_inno_phy_port ports[INNO_PHY_PORT_NUM];
};
@@ -45,17 +59,27 @@ static void hisi_inno_phy_write_reg(struct hisi_inno_phy_priv *priv,
{
void __iomem *reg = priv->mmio;
u32 val;
-
- val = (data & PHY_TEST_DATA) |
- ((addr << 8) & PHY_TEST_ADDR) |
- ((port << 16) & PHY_TEST_PORT) |
- PHY_TEST_WREN | PHY_TEST_RST;
+ u32 value;
+
+ if (priv->type == PHY_TYPE_0)
+ val = (data & PHY_TEST_DATA) |
+ ((addr << PHY_TEST_ADDR_OFFSET) & PHY0_TEST_ADDR) |
+ ((port << PHY0_TEST_PORT_OFFSET) & PHY0_TEST_PORT) |
+ PHY0_TEST_WREN | PHY0_TEST_RST;
+ else
+ val = (data & PHY_TEST_DATA) |
+ ((addr << PHY_TEST_ADDR_OFFSET) & PHY1_TEST_ADDR) |
+ ((port << PHY1_TEST_PORT_OFFSET) & PHY1_TEST_PORT) |
+ PHY1_TEST_WREN | PHY1_TEST_RST;
writel(val, reg);
- val |= PHY_TEST_CLK;
- writel(val, reg);
+ value = val;
+ if (priv->type == PHY_TYPE_0)
+ value |= PHY0_TEST_CLK;
+ else
+ value |= PHY1_TEST_CLK;
+ writel(value, reg);
- val &= ~PHY_TEST_CLK;
writel(val, reg);
}
@@ -135,6 +159,8 @@ static int hisi_inno_phy_probe(struct platform_device *pdev)
if (IS_ERR(priv->por_rst))
return PTR_ERR(priv->por_rst);
+ priv->type = (uintptr_t) of_device_get_match_data(dev);
+
for_each_child_of_node(np, child) {
struct reset_control *rst;
struct phy *phy;
@@ -170,8 +196,12 @@ static int hisi_inno_phy_probe(struct platform_device *pdev)
}
static const struct of_device_id hisi_inno_phy_of_match[] = {
- { .compatible = "hisilicon,inno-usb2-phy", },
- { .compatible = "hisilicon,hi3798cv200-usb2-phy", },
+ { .compatible = "hisilicon,inno-usb2-phy",
+ .data = (void *) PHY_TYPE_0 },
+ { .compatible = "hisilicon,hi3798cv200-usb2-phy",
+ .data = (void *) PHY_TYPE_0 },
+ { .compatible = "hisilicon,hi3798mv100-usb2-phy",
+ .data = (void *) PHY_TYPE_1 },
{ },
};
MODULE_DEVICE_TABLE(of, hisi_inno_phy_of_match);
--
2.39.2
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