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Date:   Sat, 30 Sep 2023 16:32:09 +0100
From:   Jonathan Cameron <jic23@...nel.org>
To:     David Lechner <dlechner@...libre.com>
Cc:     linux-iio@...r.kernel.org, devicetree@...r.kernel.org,
        linux-staging@...ts.linux.dev,
        David Lechner <david@...hnology.com>,
        Rob Herring <robh+dt@...nel.org>,
        Krzysztof Kozlowski <krzysztof.kozlowski+dt@...aro.org>,
        Conor Dooley <conor+dt@...nel.org>,
        Michael Hennerich <Michael.Hennerich@...log.com>,
        Nuno Sá <nuno.sa@...log.com>,
        Axel Haslam <ahaslam@...libre.com>,
        Philip Molloy <pmolloy@...libre.com>,
        linux-kernel@...r.kernel.org
Subject: Re: [PATCH v3 22/27] staging: iio: resolver: ad2s1210: convert LOS
 threshold to event attr

On Fri, 29 Sep 2023 12:23:27 -0500
David Lechner <dlechner@...libre.com> wrote:

> From: David Lechner <david@...hnology.com>
> 
> From: David Lechner <dlechner@...libre.com>
> 
> The AD2S1210 has a programmable threshold for the loss of signal (LOS)
> fault. This fault is triggered when either the sine or cosine input
> falls below the threshold voltage.
> 
> This patch converts the custom device LOS threshold attribute to an
> event falling edge threshold attribute on a new monitor signal channel.
> The monitor signal is an internal signal that combines the amplitudes
> of the sine and cosine inputs as well as the current angle and position
> output. This signal is used to detect faults in the input signals.
> 
> The attribute now uses millivolts instead of the raw register value in
> accordance with the IIO ABI.
> 
> Emitting the event will be implemented in a later patch.
> 
> Signed-off-by: David Lechner <dlechner@...libre.com>

I think I'm fine with treating these internal signals like this, but
I would ideally like someone from Analog devices to take a look at how
these are being done and make sure our interpretations of the signals
make sense to them.  We are pushing the boundaries a little here (though
we have done similar before for fault events I think.)

Jonathan

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