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Message-ID: <36a8ca4-50b5-f177-d1c0-5fddaac5041@linux.intel.com>
Date: Mon, 2 Oct 2023 14:45:16 +0300 (EEST)
From: Ilpo Järvinen <ilpo.jarvinen@...ux.intel.com>
To: Jithu Joseph <jithu.joseph@...el.com>
cc: Hans de Goede <hdegoede@...hat.com>, markgross@...nel.org,
tglx@...utronix.de, mingo@...hat.com, bp@...en8.de,
dave.hansen@...ux.intel.com, x86@...nel.org, hpa@...or.com,
rostedt@...dmis.org, ashok.raj@...el.com, tony.luck@...el.com,
LKML <linux-kernel@...r.kernel.org>,
platform-driver-x86@...r.kernel.org, patches@...ts.linux.dev,
ravi.v.shankar@...el.com, pengfei.xu@...el.com
Subject: Re: [PATCH v3 4/9] platform/x86/intel/ifs: Gen2 Scan test support
On Fri, 29 Sep 2023, Jithu Joseph wrote:
> Width of chunk related bitfields is ACTIVATE_SCAN and SCAN_STATUS MSRs
> are different in newer IFS generation compared to gen0.
>
> Make changes to scan test flow such that MSRs are populated
> appropriately based on the generation supported by hardware.
>
> Account for the 8/16 bit MSR bitfield width differences between gen0 and
> newer generations for the scan test trace event too.
>
> Signed-off-by: Jithu Joseph <jithu.joseph@...el.com>
> Reviewed-by: Tony Luck <tony.luck@...el.com>
> Tested-by: Pengfei Xu <pengfei.xu@...el.com>
Reviewed-by: Ilpo Järvinen <ilpo.jarvinen@...ux.intel.com>
--
i.
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