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Date: Thu, 11 Apr 2024 16:34:09 -0700
From: Andrew Morton <akpm@...ux-foundation.org>
To: Edward Liaw <edliaw@...gle.com>
Cc: linux-kernel@...r.kernel.org, Kees Cook <keescook@...omium.org>, Andy
 Lutomirski <luto@...capital.net>, Will Drewry <wad@...omium.org>, Shuah
 Khan <shuah@...nel.org>, Nathan Chancellor <nathan@...nel.org>, Nick
 Desaulniers <ndesaulniers@...gle.com>, Bill Wendling <morbo@...gle.com>,
 Justin Stitt <justinstitt@...gle.com>, Peter Xu <peterx@...hat.com>, David
 Hildenbrand <david@...hat.com>, Axel Rasmussen <axelrasmussen@...gle.com>,
 "Mike Rapoport (IBM)" <rppt@...nel.org>, linux-kselftest@...r.kernel.org,
 kernel-team@...roid.com, linux-mm@...ck.org, llvm@...ts.linux.dev
Subject: Re: [PATCH] selftests/harness: remove use of LINE_MAX

On Thu, 11 Apr 2024 23:19:49 +0000 Edward Liaw <edliaw@...gle.com> wrote:

> Android was seeing a compliation error because its C library does not
> define LINE_MAX.  This replaces the use of LINE_MAX / snprintf with
> asprintf, which will change the behavior to not truncate the test name
> if it is over 2048 chars long.

Thanks, I'll grab and shall send it Linuswards for 6.9-rcX.

I added

Fixes: 38c957f07038 ("selftests: kselftest_harness: generate test name once")


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