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Message-ID: <tencent_5CDC08544C901D5ECA270573D5AEE3117108@qq.com>
Date: Fri, 5 Dec 2025 11:15:13 +0800
From: xiaopeitux@...mail.com
To: linux@...ck-us.net,
linux-hwmon@...r.kernel.org,
linux-kernel@...r.kernel.org,
florin.leotescu@....com
Cc: Pei Xiao <xiaopei01@...inos.cn>
Subject: [PATCH] hwmon: (emc2305): fix device node refcount leak in error path
From: Pei Xiao <xiaopei01@...inos.cn>
The for_each_child_of_node() macro automatically manages device node
reference counts during normal iteration. However, when breaking out
of the loop early with return, the current iteration's node is not
automatically released, leading to a reference count leak.
Fix this by adding of_node_put(child) before returning from the loop
when emc2305_set_single_tz() fails.
This issue could lead to memory leaks over multiple probe cycles.
Signed-off-by: Pei Xiao <xiaopei01@...inos.cn>
---
drivers/hwmon/emc2305.c | 4 +++-
1 file changed, 3 insertions(+), 1 deletion(-)
diff --git a/drivers/hwmon/emc2305.c b/drivers/hwmon/emc2305.c
index 60809289f816..84cb9b72cb6c 100644
--- a/drivers/hwmon/emc2305.c
+++ b/drivers/hwmon/emc2305.c
@@ -685,8 +685,10 @@ static int emc2305_probe(struct i2c_client *client)
i = 0;
for_each_child_of_node(dev->of_node, child) {
ret = emc2305_set_single_tz(dev, child, i);
- if (ret != 0)
+ if (ret != 0) {
+ of_node_put(child);
return ret;
+ }
i++;
}
} else {
--
2.25.1
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