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Message-ID: <1340658258.4344.43.camel@LTIRV-MCHAN1.corp.ad.broadcom.com>
Date: Mon, 25 Jun 2012 14:04:18 -0700
From: "Michael Chan" <mchan@...adcom.com>
To: "Ben Hutchings" <bhutchings@...arflare.com>
cc: "David Miller" <davem@...emloft.net>, netdev@...r.kernel.org,
nsujir@...adcom.com, mcarlson@...adcom.com
Subject: Re: [PATCH 3/3 net-next] tg3: Add sysfs file to export sensor
data
On Sat, 2012-06-23 at 16:02 +0100, Ben Hutchings wrote:
> Temperature and voltage can be exposed through an hwmon device (which
> practically means you use multiple attributes with conventional names).
> Other diagnostics might possible be suitable for ethtool stats,
> depending on what they are.
I think we can extract some common and more useful attributes such as
temperature and voltage, and use the standard hwmon attributes to expose
them.
>
> If the driver can't easily parse the information (e.g. it varies greatly
> between the different chips and firmware versions) then a binary
> attribute or private ioctl might be appropriate. But generic interfaces
> really should be considered first.
>
The rest of the bulk data requires too much parsing in the kernel and
will have to be exposed as binary data. What do you mean by binary
attribute? A new binary sysfs attribute under hwmon? Or outside of
hwmon? And please elaborate on the private ioctl.
Thanks.
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