netdev - Re: [PATCH net-next] test_bpf: extend tests for 32-bit endianness conversion

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Message-ID: <558E6980.5070101@iogearbox.net>
Date:	Sat, 27 Jun 2015 11:14:40 +0200
From:	Daniel Borkmann <daniel@...earbox.net>
To:	Xi Wang <xi.wang@...il.com>, netdev@...r.kernel.org
CC:	linux-kernel@...r.kernel.org, Alexei Starovoitov <ast@...mgrid.com>
Subject: Re: [PATCH net-next] test_bpf: extend tests for 32-bit endianness
 conversion

On 06/26/2015 05:25 PM, Xi Wang wrote:
> Currently "ALU_END_FROM_BE 32" and "ALU_END_FROM_LE 32" do not test if
> the upper bits of the result are zeros (the arm64 JIT had such bugs).
> Extend the two tests to catch this.
>
> Cc: Alexei Starovoitov <ast@...mgrid.com>
> Signed-off-by: Xi Wang <xi.wang@...il.com>

Thanks for extending the test suite!

Acked-by: Daniel Borkmann <daniel@...earbox.net>
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