netdev - [PATCH/RFC v2 bpf-next 12/19] selftests: enable hi32 randomization for "test_progs" and "test

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Message-Id: <1554925833-7333-13-git-send-email-jiong.wang@netronome.com>
Date:   Wed, 10 Apr 2019 20:50:26 +0100
From:   Jiong Wang <jiong.wang@...ronome.com>
To:     alexei.starovoitov@...il.com, daniel@...earbox.net
Cc:     bpf@...r.kernel.org, netdev@...r.kernel.org,
        oss-drivers@...ronome.com, Jiong Wang <jiong.wang@...ronome.com>
Subject: [PATCH/RFC v2 bpf-next 12/19] selftests: enable hi32 randomization for "test_progs" and "test_verifier"

"test_progs" contains a couple of C based tests, so is a very good
assurance on the pass correctness for this patch set.

After this patch, BPF_F_TEST_RND_HI32 will be set for all of them and
high 32-bit are randomized when possible. This could deliver quite
stressful tests on x86_64.

hi32 randomized is enabled for "test_verifier" as well. But two testcases
needs adjustments due to 16-bit jump distance overflow.
  - "ld_abs: vlan + abs, test1"
    The function "bpf_fill_ld_abs_vlan_push_pop" inside test_verifier.c
    needs to use ALU64 to avoid insertion of hi32 randomization sequence
    that would overflow the sequence.
  - bpf_fill_jump_around_ld_abs needs to consider hi32 randomization to the
    load dst of ld_abs.

Signed-off-by: Jiong Wang <jiong.wang@...ronome.com>
---
 tools/testing/selftests/bpf/test_progs.c    | 2 ++
 tools/testing/selftests/bpf/test_verifier.c | 7 +++++--
 2 files changed, 7 insertions(+), 2 deletions(-)

diff --git a/tools/testing/selftests/bpf/test_progs.c b/tools/testing/selftests/bpf/test_progs.c
index bf5c909..4249b5b 100644
--- a/tools/testing/selftests/bpf/test_progs.c
+++ b/tools/testing/selftests/bpf/test_progs.c
@@ -172,6 +172,8 @@ int main(int ac, char **av)
 	if (ac == 2 && strcmp(av[1], "-s") == 0)
 		verifier_stats = true;
 
+	libbpf_test_mode = true;
+
 #define CALL
 #include <prog_tests/tests.h>
 #undef CALL
diff --git a/tools/testing/selftests/bpf/test_verifier.c b/tools/testing/selftests/bpf/test_verifier.c
index e2ebcad..7d067e0 100644
--- a/tools/testing/selftests/bpf/test_verifier.c
+++ b/tools/testing/selftests/bpf/test_verifier.c
@@ -161,7 +161,7 @@ static void bpf_fill_ld_abs_vlan_push_pop(struct bpf_test *self)
 		goto loop;
 
 	for (; i < len - 1; i++)
-		insn[i] = BPF_ALU32_IMM(BPF_MOV, BPF_REG_0, 0xbef);
+		insn[i] = BPF_ALU64_IMM(BPF_MOV, BPF_REG_0, 0xbef);
 	insn[len - 1] = BPF_EXIT_INSN();
 	self->prog_len = len;
 }
@@ -170,7 +170,7 @@ static void bpf_fill_jump_around_ld_abs(struct bpf_test *self)
 {
 	struct bpf_insn *insn = self->fill_insns;
 	/* jump range is limited to 16 bit. every ld_abs is replaced by 6 insns */
-	unsigned int len = (1 << 15) / 6;
+	unsigned int len = (1 << 15) / 9;
 	int i = 0;
 
 	insn[i++] = BPF_MOV64_REG(BPF_REG_6, BPF_REG_1);
@@ -1014,5 +1014,8 @@ int main(int argc, char **argv)
 	}
 
 	bpf_semi_rand_init();
+
+	libbpf_test_mode = true;
+
 	return do_test(unpriv, from, to);
 }
-- 
2.7.4