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Message-id: <2073119.W2NaKLyeRo@amdc3058>
Date: Wed, 02 May 2018 11:41:42 +0200
From: Bartlomiej Zolnierkiewicz <b.zolnierkie@...sung.com>
To: Daniel Lezcano <daniel.lezcano@...aro.org>
Cc: Eduardo Valentin <edubezval@...il.com>,
Zhang Rui <rui.zhang@...el.com>,
linux-samsung-soc@...r.kernel.org, linux-pm@...r.kernel.org,
linux-kernel@...r.kernel.org
Subject: Re: [PATCH 15/18] thermal: exynos: check return values of
->get_trip_[temp,hyst] methods
On Tuesday, May 01, 2018 12:43:04 PM Daniel Lezcano wrote:
> On Thu, Apr 26, 2018 at 01:51:30PM +0200, Bartlomiej Zolnierkiewicz wrote:
> > Check return values of ->get_trip_[temp,hyst] methods in
> > exynos_tmu_initialize().
> >
> > Signed-off-by: Bartlomiej Zolnierkiewicz <b.zolnierkie@...sung.com>
> > ---
> > drivers/thermal/samsung/exynos_tmu.c | 10 +++++++---
> > 1 file changed, 7 insertions(+), 3 deletions(-)
> >
> > diff --git a/drivers/thermal/samsung/exynos_tmu.c b/drivers/thermal/samsung/exynos_tmu.c
> > index 244aaf6..abe0737 100644
> > --- a/drivers/thermal/samsung/exynos_tmu.c
> > +++ b/drivers/thermal/samsung/exynos_tmu.c
> > @@ -357,19 +357,23 @@ static int exynos_tmu_initialize(struct platform_device *pdev)
> > /* Write temperature code for rising and falling threshold */
> > for (i = 0; i < ntrips; i++) {
> > /* Write temperature code for rising threshold */
> > - tzd->ops->get_trip_temp(tzd, i, &temp);
> > + ret = tzd->ops->get_trip_temp(tzd, i, &temp);
> > + if (ret)
> > + goto err;
> > temp /= MCELSIUS;
> > data->tmu_set_trip_temp(data, i, temp);
> >
> > /* Write temperature code for falling threshold */
> > - tzd->ops->get_trip_hyst(tzd, i, &hyst);
> > + ret = tzd->ops->get_trip_hyst(tzd, i, &hyst);
> > + if (ret)
> > + goto err;
>
> Could this fail for 4210 ?
It can't, please see the method implementation in of-thermal.c:
static int of_thermal_get_trip_hyst(struct thermal_zone_device *tz, int trip,
int *hyst)
{
struct __thermal_zone *data = tz->devdata;
if (trip >= data->ntrips || trip < 0)
return -EDOM;
*hyst = data->trips[trip].hysteresis;
return 0;
}
> > hyst /= MCELSIUS;
> > data->tmu_set_trip_hyst(data, i, temp, hyst);
> > }
> >
> > data->tmu_clear_irqs(data);
> > }
> > -
> > +err:
> > clk_disable(data->clk);
> > mutex_unlock(&data->lock);
> > if (!IS_ERR(data->clk_sec))
Best regards,
--
Bartlomiej Zolnierkiewicz
Samsung R&D Institute Poland
Samsung Electronics
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