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Date:   Fri, 30 Jul 2021 12:45:59 +0200
From:   Petr Mladek <pmladek@...e.com>
To:     Andy Shevchenko <andriy.shevchenko@...ux.intel.com>
Cc:     Richard Fitzgerald <rf@...nsource.cirrus.com>,
        linux-kernel@...r.kernel.org, Steven Rostedt <rostedt@...dmis.org>,
        Sergey Senozhatsky <senozhatsky@...omium.org>,
        Rasmus Villemoes <linux@...musvillemoes.dk>,
        kernel test robot <oliver.sang@...el.com>
Subject: Re: [PATCH v1 1/1] lib/test_scanf: Handle n_bits == 0 in random tests

On Tue 2021-07-27 18:01:32, Andy Shevchenko wrote:
> UBSAN reported (via LKP)
> 
> [   11.021349][    T1] UBSAN: shift-out-of-bounds in lib/test_scanf.c:275:51
> [   11.022782][    T1] shift exponent 32 is too large for 32-bit type 'unsigned int'
> 
> When n_bits == 0, the shift is out of range. Switch code to use GENMASK
> to handle this case.
> 
> Fixes: 50f530e176ea ("lib: test_scanf: Add tests for sscanf number conversion")
> Reported-by: kernel test robot <oliver.sang@...el.com>
> Signed-off-by: Andy Shevchenko <andriy.shevchenko@...ux.intel.com>

The patch is committed in linux/printk.git, branch for-5.15.

I would send it for 4.14 if there was another urgent fix needed.
But this one does not look important enough to hurry it up alone.

Best Regards,
Petr

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