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Message-ID: <CAHp75Ve4RuJLMdpdKe14nobuZHRNKA7tWt4yE82+noF5p+xxpw@mail.gmail.com>
Date: Wed, 22 Dec 2021 14:38:13 +0200
From: Andy Shevchenko <andy.shevchenko@...il.com>
To: Liam Beguin <liambeguin@...il.com>
Cc: Peter Rosin <peda@...ntia.se>, Jonathan Cameron <jic23@...nel.org>,
Lars-Peter Clausen <lars@...afoo.de>,
Linux Kernel Mailing List <linux-kernel@...r.kernel.org>,
linux-iio <linux-iio@...r.kernel.org>,
devicetree <devicetree@...r.kernel.org>,
Rob Herring <robh+dt@...nel.org>
Subject: Re: [PATCH v11 11/15] iio: test: add basic tests for the iio-rescale driver
On Wed, Dec 22, 2021 at 5:47 AM Liam Beguin <liambeguin@...il.com> wrote:
>
> From: Liam Beguin <lvb@...hos.com>
>
> The iio-rescale driver supports various combinations of scale types and
> offsets. These can often result in large integer multiplications. Make
> sure these calculations are done right by adding a set of kunit test
> cases that build on top of iio-test-format.
...
> + int fract_mult = 100000000LL;
Perhaps also change to use the prefix?
...
> + *nano = (s64)tmp * 10 * fract_mult + tmp2;
I'm also puzzled what the meaning of the 10 is here?
...
> + err = 1000000 * abs(exp - real);
Prefix?
...
> + err = div64_u64(err, abs(exp));
> + return (int)err;
return div64_u64();
--
With Best Regards,
Andy Shevchenko
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