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Message-ID: <16eee6cd-64c5-bfac-5217-d6f167a2a5c5@huawei.com>
Date: Tue, 16 May 2023 18:50:57 +0800
From: liulongfang <liulongfang@...wei.com>
To: Jason Gunthorpe <jgg@...dia.com>
CC: <alex.williamson@...hat.com>,
<shameerali.kolothum.thodi@...wei.com>,
<jonathan.cameron@...wei.com>, <cohuck@...hat.com>,
<linux-kernel@...r.kernel.org>, <linuxarm@...neuler.org>
Subject: Re: [PATCH v10 3/5] hisi_acc_vfio_pci: register debugfs for hisilicon
migration driver
On 2023/5/16 17:40, liulongfang wrote:
> On 2023/4/21 22:31, Jason Gunthorpe wrote:
>> On Fri, Apr 21, 2023 at 11:32:47AM +0800, liulongfang wrote:
>>
>>> Thank you for your suggestion, but the current debugfs method can already
>>> meet the functional requirements of verification testing and
>>> problem location.
>>
>> To be clear, I'm against adding selftest code in this manner. We have
>> many frameworks for kernel teesting, please pick one and integrate
>> with it.
>>
>
> Hi, Jason:
> The purpose of this hisi_acc_vf_debug_restore function is to obtain the
> migration status data of the migration device. It is a debug operation.
> Just to obtain this status data, user need to complete the few steps> of live migration.
> Therefore, it is a debug function here, not a self-test function.
>
Here it should be:
In order to test whether the current state of the device is normal,
perform a recovery test through the data saved during the previous live migration.
It is matched with the previous save.
If you still insist that it is a self-test.
How about I delete this recovery debugfs?
Thanks,
Longfang.
> Thanks,
> Longfang.
>> Jason
>> .
>>
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