linux-kernel - Re: [PATCH 1/2] dt-bindings: misc: bist: Add BIST dt-binding for TI K3 devices

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Message-ID: <ho7ktcnbtl7mvamfthqho23co2fc4z7bgjha7pu4wivxm6ndhu@tfbpveonhckz>
Date: Fri, 29 Nov 2024 08:20:08 +0100
From: Krzysztof Kozlowski <krzk@...nel.org>
To: Neha Malcom Francis <n-francis@...com>
Cc: nm@...com, vigneshr@...com, kristo@...nel.org, robh@...nel.org, 
	krzk+dt@...nel.org, conor+dt@...nel.org, linux-arm-kernel@...ts.infradead.org, 
	devicetree@...r.kernel.org, linux-kernel@...r.kernel.org, u-kumar1@...com
Subject: Re: [PATCH 1/2] dt-bindings: misc: bist: Add BIST dt-binding for TI
 K3 devices

On Thu, Nov 28, 2024 at 07:38:24PM +0530, Neha Malcom Francis wrote:
> Document the binding for TI K3 BIST (Built-In Self Test) block.
> 

A nit, subject: drop second/last, redundant "dt-binding". The
"dt-bindings" prefix is already stating that these are bindings.
See also:
https://elixir.bootlin.com/linux/v6.7-rc8/source/Documentation/devicetree/bindings/submitting-patches.rst#L18

> Signed-off-by: Neha Malcom Francis <n-francis@...com>
> ---
>  .../bindings/misc/ti,j784s4-bist.yaml         | 66 +++++++++++++++++++
>  1 file changed, 66 insertions(+)
>  create mode 100644 Documentation/devicetree/bindings/misc/ti,j784s4-bist.yaml

soc directory, not misc.

> 
> diff --git a/Documentation/devicetree/bindings/misc/ti,j784s4-bist.yaml b/Documentation/devicetree/bindings/misc/ti,j784s4-bist.yaml
> new file mode 100644
> index 000000000000..bd1b42734b3d
> --- /dev/null
> +++ b/Documentation/devicetree/bindings/misc/ti,j784s4-bist.yaml
> @@ -0,0 +1,66 @@
> +# SPDX-License-Identifier: (GPL-2.0-only OR BSD-2-Clause)
> +# Copyright (C) 2024 Texas Instruments Incorporated
> +%YAML 1.2
> +---
> +$id: http://devicetree.org/schemas/misc/ti,j784s4-bist.yaml#
> +$schema: http://devicetree.org/meta-schemas/core.yaml#
> +
> +title: Texas Instruments K3 BIST
> +
> +maintainers:
> +  - Neha Malcom Francis <n-francis@...com>
> +
> +description:
> +  The BIST (Built-In Self Test) module is an IP block present in K3 devices
> +  that support triggering of BIST tests, both PBIST (Memory BIST) and LBIST
> +  (Logic BIST) on a core. Both tests are destructive in nature. At boot, BIST
> +  is executed by hardware for the MCU domain automatically as part of HW POST.
> +
> +properties:
> +  compatible:
> +    const: ti,j784s4-bist
> +
> +  reg:
> +    minItems: 2

Drop minItems

> +    maxItems: 2
> +
> +  reg-names:
> +    items:
> +      - const: cfg
> +      - const: ctrl_mmr
> +
> +  clocks:
> +    maxItems: 1
> +
> +  power-domains:
> +    maxItems: 1
> +
> +  ti,bist-instance:
> +    $ref: /schemas/types.yaml#/definitions/uint32
> +    description:
> +      the BIST instance in the SoC represented as an integer

No instance indices are allowed. Drop.

> +
> +required:
> +  - compatible
> +  - reg
> +  - reg-names
> +  - ti,bist-instance
> +
> +additionalProperties: false
> +
> +examples:
> +  - |
> +    #include <dt-bindings/soc/ti,sci_pm_domain.h>
> +    bus {
> +        #address-cells = <2>;
> +        #size-cells = <2>;
> +        bist@...0000 {

Node names should be generic. See also an explanation and list of
examples (not exhaustive) in DT specification:
https://devicetree-specification.readthedocs.io/en/latest/chapter2-devicetree-basics.html#generic-names-recommendation

Come with something, don't just use device name.

> +            compatible = "ti,j784s4-bist";
> +            reg = <0x00 0x033c0000 0x00 0x400>,
> +            <0x00 0x0010c1a0 0x00 0x01c>;

Misaligned code.

Best regards,
Krzysztof