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Message-ID: <837d329b-bcdd-4c3b-b508-e916b110ce25@ti.com>
Date: Fri, 29 Nov 2024 13:13:37 +0530
From: Neha Malcom Francis <n-francis@...com>
To: Krzysztof Kozlowski <krzk@...nel.org>
CC: <nm@...com>, <vigneshr@...com>, <kristo@...nel.org>, <robh@...nel.org>,
<krzk+dt@...nel.org>, <conor+dt@...nel.org>,
<linux-arm-kernel@...ts.infradead.org>, <devicetree@...r.kernel.org>,
<linux-kernel@...r.kernel.org>, <u-kumar1@...com>
Subject: Re: [PATCH 1/2] dt-bindings: misc: bist: Add BIST dt-binding for TI
K3 devices
Hi Krzysztof,
On 29/11/24 12:50, Krzysztof Kozlowski wrote:
> On Thu, Nov 28, 2024 at 07:38:24PM +0530, Neha Malcom Francis wrote:
>> Document the binding for TI K3 BIST (Built-In Self Test) block.
>>
>
> A nit, subject: drop second/last, redundant "dt-binding". The
> "dt-bindings" prefix is already stating that these are bindings.
> See also:
> https://elixir.bootlin.com/linux/v6.7-rc8/source/Documentation/devicetree/bindings/submitting-patches.rst#L18
>
>> Signed-off-by: Neha Malcom Francis <n-francis@...com>
>> ---
>> .../bindings/misc/ti,j784s4-bist.yaml | 66 +++++++++++++++++++
>> 1 file changed, 66 insertions(+)
>> create mode 100644 Documentation/devicetree/bindings/misc/ti,j784s4-bist.yaml
>
> soc directory, not misc.
>
>>
>> diff --git a/Documentation/devicetree/bindings/misc/ti,j784s4-bist.yaml b/Documentation/devicetree/bindings/misc/ti,j784s4-bist.yaml
>> new file mode 100644
>> index 000000000000..bd1b42734b3d
>> --- /dev/null
>> +++ b/Documentation/devicetree/bindings/misc/ti,j784s4-bist.yaml
>> @@ -0,0 +1,66 @@
>> +# SPDX-License-Identifier: (GPL-2.0-only OR BSD-2-Clause)
>> +# Copyright (C) 2024 Texas Instruments Incorporated
>> +%YAML 1.2
>> +---
>> +$id: http://devicetree.org/schemas/misc/ti,j784s4-bist.yaml#
>> +$schema: http://devicetree.org/meta-schemas/core.yaml#
>> +
>> +title: Texas Instruments K3 BIST
>> +
>> +maintainers:
>> + - Neha Malcom Francis <n-francis@...com>
>> +
>> +description:
>> + The BIST (Built-In Self Test) module is an IP block present in K3 devices
>> + that support triggering of BIST tests, both PBIST (Memory BIST) and LBIST
>> + (Logic BIST) on a core. Both tests are destructive in nature. At boot, BIST
>> + is executed by hardware for the MCU domain automatically as part of HW POST.
>> +
>> +properties:
>> + compatible:
>> + const: ti,j784s4-bist
>> +
>> + reg:
>> + minItems: 2
>
> Drop minItems
>
>> + maxItems: 2
>> +
>> + reg-names:
>> + items:
>> + - const: cfg
>> + - const: ctrl_mmr
>> +
>> + clocks:
>> + maxItems: 1
>> +
>> + power-domains:
>> + maxItems: 1
>> +
>> + ti,bist-instance:
>> + $ref: /schemas/types.yaml#/definitions/uint32
>> + description:
>> + the BIST instance in the SoC represented as an integer
>
> No instance indices are allowed. Drop.
>
Question on this, this is not a property that is driven by software but rather
indicates which register sequences have to be picked up for triggering this test
from this instance. So I don't see how I can workaround this without getting
this number. Or maybe call it ID rather than instance?
>> +
>> +required:
>> + - compatible
>> + - reg
>> + - reg-names
>> + - ti,bist-instance
>> +
>> +additionalProperties: false
>> +
>> +examples:
>> + - |
>> + #include <dt-bindings/soc/ti,sci_pm_domain.h>
>> + bus {
>> + #address-cells = <2>;
>> + #size-cells = <2>;
>> + bist@...0000 {
>
> Node names should be generic. See also an explanation and list of
> examples (not exhaustive) in DT specification:
> https://devicetree-specification.readthedocs.io/en/latest/chapter2-devicetree-basics.html#generic-names-recommendation
>
> Come with something, don't just use device name.
>
>> + compatible = "ti,j784s4-bist";
>> + reg = <0x00 0x033c0000 0x00 0x400>,
>> + <0x00 0x0010c1a0 0x00 0x01c>;
>
> Misaligned code.
>
> Best regards,
> Krzysztof
>
For the rest of the comments, got it! thanks for the review!
--
Thanking You
Neha Malcom Francis
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